RESEARCH

Note: A webpage is often more a reflection of past and of some current projects. For details on our future research directions, please contact Peter Kinget.

RESEARCH PROJECTS

CURRENT

Efficient Analog-to-Feature conversion for Machine Learning Applications
Rapid Multi-Domain EM Environment Scanning using Compressive Sensing
Radiation-Hard Analog-to-Digital Converters for the Large Hadron Collider in CERN
Neutron Detectors using SONOS Devices (for NASA)
Accurate, Multi-Phase Clocking for Wireline or Optical I/O
Ultra-Low Voltage Analog and RF Design for nano-scale CMOS Technologies

PAST

High Performance Phase-locked Loops
High Performance Integrated Oscillators
Area Reduction of RF circuits
Device Mismatch
Ultra-wideband Circuits for Pulse Radio
Energy Harvesting Active Networked Tags
Ultra-Low Power Pulse Radios
Design of Highly Efficient Power Conversion Systems using Meta-Capacitors
Digital-Assisted RF
Ultra-Low Power Wake-Up Radios
Injection-Locking of Oscillators and its Applications
Flexible Radio Architectures for Cognitive Radio

RESEARCH RESOURCES & FACILITIES

CHIP FABRICATION

We have access to a number of different semiconductor processes for the fabrication of our circuits through a fabrication service provides (e.g., MOSIS, Europractice) as well as through direct relationships with companies and foundries. We currently mainly use 90nm CMOS, 0.13um CMOS, 0.18um CMOS and 0.25um/40GHz BiCMOS processes and are initiating our work in 65nm and 45nm CMOS processes. Take a look at our Chip Gallery!

COMPUTING & CAD TOOLS

We use a full set of industrial grade design tools for our IC designs. This includes tools suites from Cadence, Mentor and Agilent. We use PC desktops running Linux as well as servers running CentOS and Linux.

ANALOG & RF IC CHARACTERIZATION LABORATORY

Our lab facilities went through a substantial upgrade during 2004 and 2005 thanks to an NSF MRI Grant (with Prof. Tsividis) in conjunction with funding from Columbia University and the School of Engineering. We currently have a state-of-the-art measurement facility for IC characterization from DC to 40 GHz. We can measure on wafer circuits or packaged devices. Our instruments allow a full characterization in the frequency domain and time domain.